Chemical Technology September 2015

At-Line analysis of sulphur in fuels using ED-XRF spectroscopy A new application brief explaining how the use of ED-XRF spectroscopy for at- line analysis of sulphur in fuels can cut production delays from days to minutes is now available to download from http:// xrf.spectro.com/spectroscout/at-line/ analysis-of-sulphur-in-fuels. Spectrocopy," with a por- table ED-XRF spectrometer, at-line analysis can be per- formed once the sample is collected from any process point — and it fully conforms to the ASTMD4294 require- ment for analysis time of 1 to 5 min per sample." In addition to an intro-

FOCUS ON CONTROL

& INSTRUMENTATION

Sulphur content is a key quality deter- minant for many petroleum products and the knowledge of the content of sulphur in fuels impacts processing and assists compliance with government regulations. Traditionally, the analysis of sulphur in fuels has been performed in the laboratory using XRF spectroscopy. However, the practice often results in production delays due to the time required to transport samples from the line to the laboratory as well as the time samples spend waiting in queue in the lab to be processed. Now, a new generation of portable ED-XRF spectrometers is enabling rapid and accurate at-line analysis — right at the production line — for many applica- tions requiring the detection of sulphur in fuels. According to the new application brief, "At-Line Analysis of Sulphur in Fuels According to ASTM D4294 Using ED-XRF

duction and discussion of the need for at-line QC, the new brief discusses the advances and advantages of portable ED-XRF technol- ogy for at-line analysis of sulphur in fuels. The brief also documents, in detail, the at-line analysis of a

out in ASTM D4294. The brief concludes with helpful guid- ance for the specification and selection of an at-line ED-XRF system. For more information contact Tom Milner, in Germany, on tel: +49 2821 8920 or Don Goncalves, in the USA on tel: +1-781- 793-9380 or dgoncalves@tizinc.com z

series of samples using a SPECTROSCOUT portable spectrometer equipped with a transmission target X-ray tube (Rh target), a filter changer, a helium purge system and a high resolution large area SDD. The resolution of the SDD used amounted to <155 eV (Mn Kα) at an input count rate of up to 200,000 cps. The results from the tests showed compliance with criteria set

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Chemical Technology • September 2015